The phenomenon of interference is presented when the x - ray beam hits the thin layer sample at glancing angle , the angles corresponding maximal and minimal intensity of x - ray fluorescence are described when the phenomenon of double - beam interference or multiple - beam interference is occurred 介绍了掠射x射线与薄膜样品作用时产生的干涉现象，给出了x射线双光束干涉和多光束干涉产生极值的条件。
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